ISO DIS 26262-11-2016 道路车辆-功能安全第11部分关于IS026262在半导体应用中的指南
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© ISO 2016
Road vehicles — Functional safety —
Part 11:
Guideline on application of ISO 26262 to semiconductors
Véhicules routiers — Sécurité fonctionnelle —
Partie 11: titre manque
ICS: 43.040.10
Reference number
ISO/DIS 26262-11:2016(E)
DRAFT INTERNATIONAL STANDARD
ISO/DIS 26262-11
ISO/TC 22/SC 32 Secretariat: JISC
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2016-09-21 2016-12-13
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ISO/DIS 26262-11:2016(E)
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ISO DIS 26262-11:2016(E)
© ISO 2016 – All rights reserved 3
Contents
Foreword................................................................................................................................................................................... 7
Introduction ............................................................................................................................................................................ 8
1. Scope ..........................................................................................................................................................................10
2. Normative references ........................................................................................................................................10
3. Terms and definitions........................................................................................................................................11
4. A semiconductor component and its partitioning ................................................................................11
4.1 How to consider a semiconductor component ................................................................................................ 11
4.1.1 Semiconductor component development......................................................................................................... 11
4.2 Dividing a semiconductor component in parts ............................................................................................... 12
4.3 About hardware faults, errors and failure modes.......................................................................................... 12
4.3.1 Fault models.............................................................................................................................................................. 13
4.3.2 Failure modes ........................................................................................................................................................... 14
4.3.3 The distribution of base failure rate across failure modes ......................................................................... 14
4.4 About adapting a semiconductor component stand-alone analysis at system level ............................ 14
4.5 Intellectual property .............................................................................................................................................. 15
4.5.1 About intellectual property .................................................................................................................................. 15
4.5.2 Category and safety requirements for intellectual property ...................................................................... 18
4.5.3 Intellectual property lifecycle.............................................................................................................................. 20
4.5.4 Work products for intellectual property .......................................................................................................... 22
4.5.5 Integration of black-box intellectual property ............................................................................................... 25
4.6 Base failure rate estimation ................................................................................................................................. 26
4.6.1 About base failure rate estimation ..................................................................................................................... 26
4.6.2 Notes on base failure rate estimation ................................................................................................................ 30
4.6.3 Permanent base failure rate calculation methods ......................................................................................... 32
4.7 Semiconductor dependent failures analysis.................................................................................................... 48
4.7.1 Introduction to DFA ................................................................................................................................................ 48
4.7.2 Relationship between DFA and safety analysis............................................................................................... 49
4.7.3 Dependent failures scenarios .............................................................................................................................. 50
4.7.4 Distinction between cascading failures and common cause failures ....................................................... 53
4.7.5 Dependent failures initiators and mitigation measures .............................................................................. 53
4.7.6 DFA workflow ........................................................................................................................................................... 58
4.7.7 Examples of dependent failures analysis.......................................................................................................... 63
4.7.8 Dependent failures between software element and hardware element ................................................. 63
4.8 Fault injection........................................................................................................................................................... 63
4.8.1 General ....................................................................................................................................................................... 63
4.8.2 Characteristics or variables of fault injection ................................................................................................. 64
4.8.3 Fault injection results ............................................................................................................................................ 66
4.9 Production and Operation .................................................................................................................................... 66
4.9.1 About Production .................................................................................................................................................... 66
4.9.2 Production Work Products ................................................................................................................................... 66
4.9.3 About service (maintenance and repair), and decommissioning .............................................................. 67
4.10 Interfaces within distributed developments ................................................................................................... 67
4.10.1 About distributed development .......................................................................................................................... 67
4.11 Confirmation measures and functional safety audit ..................................................................................... 68
4.12 Clarification on hardware integration and testing ........................................................................................ 68
5 Specific semiconductor technologies and use cases ............................................................................69
5.1 Digital components, memories ............................................................................................................................ 69
5.1.1 About digital components ..................................................................................................................................... 69
5.1.2 Fault models of digital components ................................................................................................................... 69
5.1.3 Detailed fault models of memories..................................................................................................................... 70
摘要:
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作者:大傻蛋
分类:法规规范
价格:350质量币
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时间:2026-07-12

